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Imago’s Atom Probe product lines utilize novel and proprietary ion optics to provide our customers with a quantum leap improvement in performance over traditional atom probe microscopy. While atom probe microscopy has long been a productive scientific field of study, it is the advanced ion optics within Imago's products which have led to the rapid growth of the atom probe technique. The LEAP Si and LEAP HR have enabled breakthroughs in every key instrument performance metric -- data rate, mass resolution, lateral and vertical resolution, and Field Of View. Scientists and engineers from diverse disciplines, ranging from semiconductor failure analysis to metallurgy to polymer chemistry, are utilizing Imago Atom Probe microscopes in their work.
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The LEAP Si features 175nm field of view and a data rate of 5 million ions per minute.
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The LEAP Si series provides fast time to knowledge for microelectronics professionals and other researchers for whom time is of the essence. Key features include: largest field of view, highest data rate, excellent mass resolution, and simplified sample preparation using microtip arrays. With the LEAP Si measurements that would have taken months, or been completely impossible, can be accomplished in a matter of hours. Click here for further information on the LEAP Si series. |
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The LEAP HR offers the ultimate in mass resolution.
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The LEAP HR microscope’s patented Large Angle Reflectron (LAR) design is optimized for ultra-high mass resolution while maintaining a wide field-of-view. This enables elements and isotopes with nearly identical mass-to-charge ratios to be uniquely characterized, a key factor in the analysis of metals and advanced materials.
Click here for further information on the LEAP HR series. |
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These products are protected by one or more of the following U.S. patents and other patent applications pending:
5,061,850; 5,440,124; 6,576,900; 6,580,069; 6,661,013; 6,700,121; 6,762,415; 7,019,307 and 7,157,702
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